Please use this identifier to cite or link to this item: http://hdl.handle.net/11189/5187
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dc.contributor.authorMeacci, Valentino-
dc.contributor.authorRicci, Stefano-
dc.contributor.authorWiklund, Johan-
dc.contributor.authorBirkhofer, Beat-
dc.contributor.authorKotzé, Reinhardt-
dc.date.accessioned2016-09-26T06:23:55Z-
dc.date.available2016-09-26T06:23:55Z-
dc.date.issued2016-
dc.identifier.urihttp://hdl.handle.net/11189/5187-
dc.description.abstractThe continuous monitoring of rheological parameters of industrial fluids during production is of paramount importance for process and quality control. Up to now, no system capable of a complete and non-invasive in-line measurement is commercially available, so that only time discrete laboratory measurements on fluids specimens are possible. In this work a new, fully integrated ultrasound system for in-line fluid characterization, named Flow-Viz, is presented. The system measures the velocity profile of the fluid moving in a pipe through pulsed Doppler ultrasound, and combines it with the pressure drop. The electronics, featuring two ultrasound transmission/reception channels used alone or in pitch-catch configuration, includes powerful digital processing capabilities for real-time velocity profile calculation, and is fully programmable. Particular attention is paid to low-noise design for achieving the optimal performance in highly attenuating suspensions. An application is presented where the system, coupled to a non-invasive ultrasound sensor unit, performs in-line rheological measurements through the wall of a high-grade stainless steel pipe.en_US
dc.language.isoenen_US
dc.publisherIEEEen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-sa/3.0/za/en
dc.subjectUltrasonic imagingen_US
dc.subjectField programmable gate arraysen_US
dc.subjectViscosityen_US
dc.subjectUltrasonic variables measurementen_US
dc.subjectVelocity measurementen_US
dc.subjectDoppler effecten_US
dc.titleFlow-Viz – An integrated digital in-line fluid characterization system for industrial applicationsen_US
dc.type.patentOtheren_US
Appears in Collections:Eng - Conference Papers
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