Please use this identifier to cite or link to this item: http://hdl.handle.net/11189/4723
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dc.contributor.authorKheswa, NYen_US
dc.contributor.authorPapka, Pen_US
dc.contributor.authorPineda-Vargas, C.A.en_US
dc.contributor.authorNewman, RTen_US
dc.date.accessioned2016-07-25T13:57:37Z-
dc.date.available2016-07-25T13:57:37Z-
dc.date.issued2011-
dc.identifier.urihttp://dx.doi.org/10.1016/j.nima.2011.06.026-
dc.identifier.urihttp://hdl.handle.net/11189/4723-
dc.description.abstractWe report on the thickness and homogeneity characterization of thin metallic targets of Zr-96 by means of alpha absorption spectrometry, Particle Induced X-ray Emission (PIXE) and X-ray absorption. The target thicknesses determined by means of the above mentioned methods are critically compared. The thicknesses were determined before and after irradiation with a 70 MeV beam of 14N ions.en_US
dc.language.isoenen_US
dc.publisherElsevieren_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-sa/3.0/za/en
dc.subjectTarget characterizationen_US
dc.subjectPIXEen_US
dc.subjectAlpha spectrometryen_US
dc.subjectX-ray absorptionen_US
dc.subjectTarget thicknessen_US
dc.titleTarget characterisation by PIXE, alpha spectrometry and X-ray absorption nuclear instruments and methods in physics research section A – accelerators, spectrometers, detectors and associated equipmenten_US
dc.type.patentArticleen_US
Appears in Collections:HWSci - Journal Articles (DHET subsidised)
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