Please use this identifier to cite or link to this item: http://hdl.handle.net/11189/9198
DC FieldValueLanguage
dc.contributor.authorMquqwana, Manduleli Alfreden_US
dc.contributor.authorKrishnamurthy, Senthilen_US
dc.date.accessioned2023-08-08T11:06:49Z-
dc.date.available2023-08-08T11:06:49Z-
dc.date.issued2022-
dc.identifier.citationMquqwana, M. A. & Krishnamurthy, S. 2022. System-based testing of protection for center-tapped shunt capacitor banks. Energies, 15: 3791. [https:// doi.org/10.3390/en15103791]en_US
dc.identifier.issn1996-1073-
dc.identifier.urihttp://hdl.handle.net/11189/9198-
dc.description.abstractIn power systems, capacitor banks play a significant role in improving voltage profiles, reducing losses, and adjusting power factors. Security measures must be implemented quickly and reliably to protect them from a wide range of threats. As a consequence of capacitor bank failures, finding and fixing the damaged units/elements is more difficult, which may lead to voltage control difficulties or the loss of any of these benefits. The paper shows the application of system-based testing methods for protection systems using RelaySimTest software, which works with OMICRON injection test sets. System-based testing methods are applied to test voltage differential protection for center-tapped shunt capacitor banks. The use of system-based testing methods has many advantages over conventional testing methods, which include distributed testing, transient state conditions testing, etc., which in turn result in cost savings during the commissioning and testing phase. The impact of external faults on bank installation has been tested successfullyen_US
dc.language.isoenen_US
dc.publisherMDPIen_US
dc.relation.ispartofEnergiesen_US
dc.subjectCapacitor bank protectionen_US
dc.subjectsystem-based testingen_US
dc.subjectvoltage differential protectionen_US
dc.subjectcenter-tapped capacitor banksen_US
dc.titleSystem-based testing of protection for center-tapped shunt capacitor banksen_US
dc.identifier.doihttps:// doi.org/10.3390/en15103791-
dc.typeArticleen_US
Appears in Collections:Eng - Journal articles (DHET subsidised)
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