Browsing by Subject Backscattering
Showing results 1 to 1 of 1
| Issue Date | Title | Author(s) |
|---|---|---|
| 2013 | Application of particle-induced X-ray emission, backscattering spectrometry and scanning electron microscopy in the evaluation of orthodontic materials | Gihwala, D; Mars, JA; Pineda-Vargas, C |