Please use this identifier to cite or link to this item: http://hdl.handle.net/11189/4723
Title: Target characterisation by PIXE, alpha spectrometry and X-ray absorption nuclear instruments and methods in physics research section A – accelerators, spectrometers, detectors and associated equipment
Authors: Kheswa, NY
Papka, P
Pineda-Vargas, CA
Newman, RT
Keywords: Target characterization;PIXE;Alpha spectrometry;X-ray absorption;Target thickness
Issue Date: 2011
Publisher: Elsevier
Abstract: We report on the thickness and homogeneity characterization of thin metallic targets of Zr-96 by means of alpha absorption spectrometry, Particle Induced X-ray Emission (PIXE) and X-ray absorption. The target thicknesses determined by means of the above mentioned methods are critically compared. The thicknesses were determined before and after irradiation with a 70 MeV beam of 14N ions.
URI: http://dx.doi.org/10.1016/j.nima.2011.06.026
http://hdl.handle.net/11189/4723
Appears in Collections:HWSci - Journal Articles (DHET subsidised)

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